yield-engineering

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rajkmrhenry-dot / lithography-cd-control-jmp

JMP-based lithography line-width CD control, SPC, ANOVA, and process capability analysis using NIST wafer data.

statistical semiconductor statistical-process-control photolithography process-capability anova-analysis jmp-statistical-software yield-engineering critical-dimension photolithography-cd

Updated Jun 4, 2026

suniliitm / Semiconductor-Algorithms-Portfolio

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A curated portfolio of Data Structures & Algorithms (DSA) re-engineered for the Semiconductor Industry. Solving real-world problems in Yield Analytics, Process Control, and Equipment Firmware using Python

python physics metrology semiconductors data-structures-and-algorithms process-control yield-engineering fab-automation

Updated Dec 22, 2025
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SikarwarPoonam / Wafer-Defect-Detection

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End-to-End Deep Learning (PyTorch) Microservice & Streamlit Dashboard for Inline Semiconductor Wafer Defect Pattern Classification (WM-811K)

docker computer-vision deep-learning pytorch semiconductor gradcam defect-detection fastapi streamlit yield-engineering

Updated Jul 31, 2026
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